This episode was recorded live at SEMICON Europa.
Michael Zahn from Koh Young talks to Françoise von Trapp about the growing significance of metrology in semiconductor manufacturing and the need for advanced measurement technologies. They discuss the transition from 2D to 3D measurements in semiconductor manufacturing. Zahn explains why non-destructive, optical 3D measurements offer precise height and position data with sub-micron resolution.
You'll learn how these measurements are crucial for early defect detection, improving efficiency, and reducing waste. You'll also gain an understanding about the importance of real-time, in-line measurements for quality assurance and process optimization.
Zahn also highlights Koh Young's AI integration for process control and the future potential of sub-micron resolution systems.
Contact Michael Zahn on LinkedIn
Koh Young paves the way for smart factory solutions with 3D measurement-based inspection solutions.
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